Advantages & Limitations of Mathematical Asperity Models & Testing in Connector Technology

Date: March 19, 2025

Time: 10:40 AM – 11:00 AM

Track: AC/DC Power Infrastructure

Speakers: Rohit Narayan (nVent ERICO), Oscar Martinez (nVent ERICO)

Connections are present throughout an electrical system at every voltage level and in every piece of conductor, equipment and appliance. Modelling, design and testing is carried out on connections by researchers, test labs, users and manufacturers. We will look at advantages and limitations of asperity mathematical models and test methods in standards in IEEE 837-2014, UL 467, IEC 62561-1:2023.